Invention Grant
- Patent Title: Apparatuses, systems, and methods for error correction
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Application No.: US16911197Application Date: 2020-06-24
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Publication No.: US11340984B2Publication Date: 2022-05-24
- Inventor: Takuya Nakanishi , Toru Ishikawa , Minari Arai
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F13/16 ; G11C7/10 ; G11C7/22

Abstract:
Apparatuses, systems, and methods for error correction. A memory array may be coupled to an error correction code (ECC) circuit along a read bus and a write bus. The ECC circuit includes a read portion and a write portion. As part of a mask write operation, read data and read parity may be read out along the read bus to the read portion of the ECC circuit and write data may be received along data terminals by the write portion of the ECC circuit. The write portion of the ECC circuit may generate amended write data based on the write data and the read data, and may generate amended parity based on the read parity and the amended write data. The amended write data and amended parity may be written back to the memory array along the write bus.
Public/Granted literature
- US20210406123A1 APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION Public/Granted day:2021-12-30
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