Invention Grant
- Patent Title: Test platform employing test-independent fault insertion
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Application No.: US16874131Application Date: 2020-05-14
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Publication No.: US11341012B2Publication Date: 2022-05-24
- Inventor: Charles R. Wilson, Jr.
- Applicant: EMC IP Holding Company LLC
- Applicant Address: US MA Hopkinton
- Assignee: EMC IP Holding Company LLC
- Current Assignee: EMC IP Holding Company LLC
- Current Assignee Address: US MA Hopkinton
- Agency: BainwoodHuang
- Main IPC: G06F11/22
- IPC: G06F11/22 ; G06F11/07 ; G06F11/263 ; G06F11/27

Abstract:
A method of testing a data storage system includes maintaining libraries of test routines, a first library including a set of normal-functional tests each operable to test corresponding normal functionality of the data storage system, a second library including a set of fault inserters each being independently operable to induce a corresponding fault condition into the data storage system. Normal-functional tests are executed concurrently with one or more of the fault inserters to cause the normal-functional tests to encounter the corresponding fault conditions during execution and thereby test a response of the normal functionality of the data storage system to the occurrence of the fault conditions.
Public/Granted literature
- US20210357299A1 TEST PLATFORM EMPLOYING TEST-INDEPENDENT FAULT INSERTION Public/Granted day:2021-11-18
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