Invention Grant
- Patent Title: Electrical pathway intermittent fault detection
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Application No.: US17064057Application Date: 2020-10-06
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Publication No.: US11349433B2Publication Date: 2022-05-31
- Inventor: Katherine Han , Jack Stewart , Hai-Yue Han
- Applicant: SunPower Corporation
- Applicant Address: US CA San Jose
- Assignee: SunPower Corporation
- Current Assignee: SunPower Corporation
- Current Assignee Address: US CA San Jose
- Agency: Grasso PLLC
- Main IPC: H02S50/10
- IPC: H02S50/10 ; H02S40/34 ; G01R31/08 ; G01R31/11

Abstract:
Testing to detect intermittent electrical pathways is described. Applied currents may be reversed to fully test all components of a workpiece. Various testing methodologies may be employed. These methodologies may include Time Domain Reflectometry (TDR), mechanical agitation, dark current/voltage testing, (dark IV), i.e., electrical testing of a workpiece using applied electricity, and thermographic imaging, e.g., infra-red thermal imaging. The sensed voltage during agitation may be compared to a benchmark voltage to determine whether or not an intermittent failure exists.
Public/Granted literature
- US20210194425A1 ELECTRICAL PATHWAY INTERMITTENT FAULT DETECTION Public/Granted day:2021-06-24
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