Invention Grant
- Patent Title: Inspection flow path device and inspection apparatus
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Application No.: US16960777Application Date: 2019-01-25
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Publication No.: US11351542B2Publication Date: 2022-06-07
- Inventor: Masashi Yoneta , Jumpei Nakazono
- Applicant: KYOCERA Corporation
- Applicant Address: JP Kyoto
- Assignee: KYOCERA Corporation
- Current Assignee: KYOCERA Corporation
- Current Assignee Address: JP Kyoto
- Agency: Volpe Koenig
- Priority: JPJP2018-013698 20180130
- International Application: PCT/JP2019/002556 WO 20190125
- International Announcement: WO2019/151150 WO 20190808
- Main IPC: G01N21/00
- IPC: G01N21/00 ; B01L3/00 ; B01D43/00 ; G01N15/14 ; G01N15/00

Abstract:
An inspection flow path device according to the present disclosure comprises: a first flow path device having a plate-like shape and including a pair of first surfaces located opposite to each other in a thickness direction and a first flow path located inside and including a first opening located in the pair of first surfaces and a branch flow path; and a second flow path device having a plate-like shape and translucency and including a pair of second surfaces located opposite to each other in a thickness direction and a second flow path located inside and including a second opening located in the pair of second surfaces; wherein one of the pair of first surfaces of the first flow path device is located on one of the pair of second surfaces of the second flow path device, and the first opening and the second opening are connected to each other.
Public/Granted literature
- US20200330992A1 INSPECTION FLOW PATH DEVICE AND INSPECTION APPARATUS Public/Granted day:2020-10-22
Information query