Invention Grant
- Patent Title: Surface characteristic inspection apparatus and surface characteristic inspection program
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Application No.: US16767452Application Date: 2018-12-14
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Publication No.: US11353322B2Publication Date: 2022-06-07
- Inventor: Eiichi Nagaoka
- Applicant: HORIBA, Ltd.
- Applicant Address: JP Kyoto
- Assignee: HORIBA, Ltd.
- Current Assignee: HORIBA, Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Alleman Hall Creasman & Tuttle LLP
- Priority: JPJP2017-240832 20171215
- International Application: PCT/JP2018/046161 WO 20181214
- International Announcement: WO2019/117301 WO 20190620
- Main IPC: G01B11/30
- IPC: G01B11/30 ; G01B11/00 ; G01B11/24 ; G01N21/55

Abstract:
The present invention is intended to make it easier to perform positioning of a detection device when detecting surface characteristics of a sensing object. The invention includes a detection device, a processing part, a guidance information generation part and an informing part. The detection device detects reflection light from a sensing object by irradiating light onto the sensing object. The processing part calculates surface characteristics of the sensing object by processing data from the detection device. The guidance information generation part generates information about a distance and/or an attitude of the detection device relative to the sensing object. The informing part informs the information about the distance and/or the attitude generated by the guidance information generation part.
Public/Granted literature
- US20200370884A1 SURFACE CHARACTERISTIC INSPECTION APPARATUS AND SURFACE CHARACTERISTIC INSPECTION PROGRAM Public/Granted day:2020-11-26
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