Invention Grant
- Patent Title: Thermal analysis device, sample holder assembly and thermal analysis method
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Application No.: US17029919Application Date: 2020-09-23
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Publication No.: US11353415B2Publication Date: 2022-06-07
- Inventor: Hiroki Takaishi , Daisuke Ito , Kenta Sato
- Applicant: Netzsch-Gerätebau GmbH
- Applicant Address: DE Selb
- Assignee: Netzsch-Gerätebau GmbH
- Current Assignee: Netzsch-Gerätebau GmbH
- Current Assignee Address: DE Selb
- Agency: Whitmyer IP Group LLC
- Priority: JPJP2019-174562 20190925
- Main IPC: G01N5/00
- IPC: G01N5/00 ; G01N25/00 ; G01K7/00 ; G01K1/00 ; G01N25/20 ; G01N5/04

Abstract:
A thermal analysis device, a sample holder assembly and a thermal analysis method, capable of DSC measurement and TG measurement while simplifying replacement of a temperature sensor or the like upon damages. The thermal analysis device includes a sample holder assembly that is detachably mounted, a first sample stage and a second sample stage that are detachably mounted, a heater (heating furnace) that heats the sample holder assembly and the like, a temperature controller, a temperature measuring section for detecting a temperature difference between the sample and a reference substance, and a weight measuring section (balance) for measuring a weight difference between the sample and the reference substance. The sample holder assembly includes a first sample holder for placing a sample thereon, and a second sample holder for placing a reference substance thereon, as well as a heat sink coupled to the first sample holder and the second sample holder, respectively, through a member having a predetermined thermal resistance, for measuring the temperature difference or the weight difference.
Public/Granted literature
- US20210088460A1 Thermal Analysis Device, Sample Holder Assembly And Thermal Analysis Method Public/Granted day:2021-03-25
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