- Patent Title: Scan frequency modulation based on memory density or block usage
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Application No.: US16947713Application Date: 2020-08-13
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Publication No.: US11354037B2Publication Date: 2022-06-07
- Inventor: Vamsi Pavan Rayaprolu , Sampath K. Ratnam , Harish R. Singidi , Ashutosh Malshe , Kishore Kumar Muchherla
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
A system includes a memory component and a processing device to determine an amount of data stored at a region of a memory component and determine, based on the amount of data stored in the region of the memory component. The processing device determines a frequency to perform an operation on one or more memory cells of the region of the memory component. The processing device performs the operation on the one or more memory cells at the frequency to maintain the one or more memory cells of the region of the memory component in a first state associated with a first error rate for data stored at the one or more memory cells. The first error rate is less than a second error rate associated with a second state of the one or more memory cells.
Public/Granted literature
- US20200371690A1 SCAN FREQUENCY MODULATION BASED ON MEMORY DENSITY OR BLOCK USAGE Public/Granted day:2020-11-26
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