Invention Grant
- Patent Title: Method and test equipment for inspecting functionality of display device
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Application No.: US17095697Application Date: 2020-11-11
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Publication No.: US11355040B2Publication Date: 2022-06-07
- Inventor: Sheng-Nan Sun , Jia-yu Wang , Chi-Cheng Hung , Kun-Yen Wu
- Applicant: NOVATEK Microelectronics Corp.
- Applicant Address: TW Hsin-Chu
- Assignee: NOVATEK Microelectronics Corp.
- Current Assignee: NOVATEK Microelectronics Corp.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Main IPC: G09G3/00
- IPC: G09G3/00

Abstract:
A method for inspecting functionality of a display device and a test equipment are provided. The method for inspecting functionality of the display device is utilized in a test equipment of an auto-test system. The method includes controlling an image capturing device to capture a test image shown on a screen of the display device for generating a captured image, acquiring an encoded pattern from the captured image and decoding the encoded pattern, wherein the test image is a source image generated by an image providing device superposed with the encoded pattern, determining whether the encoded pattern is successfully decoded to generate a resultant data, and comparing the resultant data with reference data to generate a comparison result after the encoded pattern is successfully decoded, wherein the reference data comprises information associated with the test image and information associated with system configuration of the display device.
Public/Granted literature
- US20220148469A1 Method and Test Equipment for Inspecting Functionality of Display Device Public/Granted day:2022-05-12
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