Invention Grant
- Patent Title: Automated tamper detection of meter configuration parameters
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Application No.: US17036407Application Date: 2020-09-29
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Publication No.: US11356277B2Publication Date: 2022-06-07
- Inventor: Stephen John Chasko , Damien Hugoo , Dave Stenberg
- Applicant: Landis+Gyr Innovations, Inc.
- Applicant Address: US GA Alpharetta
- Assignee: Landis+Gyr Innovations, Inc.
- Current Assignee: Landis+Gyr Innovations, Inc.
- Current Assignee Address: US GA Alpharetta
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: H04L9/32
- IPC: H04L9/32 ; H04W24/10

Abstract:
A method includes storing, at a head-end system, an indication of initial configuration parameters of a configurable resource meter. The method also includes requesting, by the head-end system, a report indicating updated configuration parameters from the configurable resource meter and receiving, at the head-end system, the report indicating the updated configuration parameters of the configurable resource meter. Additionally, the method includes comparing an indication of the updated configuration parameters to the indication of the initial configuration parameters. Further, the method includes determining a potential compromise of the configurable resource meter when the indication of the updated configuration parameters is different from the indication of the initial configuration parameters.
Public/Granted literature
- US20220103371A1 AUTOMATED TAMPER DETECTION OF METER CONFIGURATION PARAMETERS Public/Granted day:2022-03-31
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