Invention Grant
- Patent Title: Semiconductor structure and operating method for improving charge transfer of image sensor device
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Application No.: US17194096Application Date: 2021-03-05
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Publication No.: US11356625B2Publication Date: 2022-06-07
- Inventor: Seiji Takahashi , Jhy-Jyi Sze
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, P.C., Intellectual Property Attorneys
- Agent Anthony King
- Main IPC: H04N5/359
- IPC: H04N5/359 ; H04N5/378 ; H01L27/146 ; H04N5/3745

Abstract:
An image sensor semiconductor device includes a first photodiode disposed in a semiconductor substrate and configured to generate charges in response to radiation, a first transistor disposed adjacent to the first photodiode, a floating diffusion region configured to store the generated charges, a reset transistor configured to reset the floating diffusion region, and a second transistor disposed over the substrate between the first photodiode and the reset transistor. The first transistor and the second transistor are configured to generate a first electric field and a second electric field, respectively, to move the charges generated by the first photodiode to the floating diffusion region.
Public/Granted literature
- US20210195125A1 SEMICONDUCTOR STRUCTURE AND OPERATING METHOD FOR IMPROVING CHARGE TRANSFER OF IMAGE SENSOR DEVICE Public/Granted day:2021-06-24
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