Invention Grant
- Patent Title: Method and apparatus for measuring frequency in wireless communication system
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Application No.: US16826015Application Date: 2020-03-20
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Publication No.: US11356879B2Publication Date: 2022-06-07
- Inventor: Donggun Kim , Soenghun Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2019-0032542 20190321
- Main IPC: H04W24/10
- IPC: H04W24/10 ; H04W76/19 ; H04W76/30 ; H04W76/27

Abstract:
A frequency measurement method performed by a user equipment (UE) in a wireless communication system is provided. The frequency measurement method includes: receiving a radio resource control (RRC) release message or system information including first frequency measurement configuration information for frequency measurement in an RRC inactive mode; performing frequency measurement in the RRC inactive mode based on the first frequency measurement configuration information; receiving first RRC resume message including an indicator requesting a measurement report in the RRC inactive mode; and transmitting an RRC resume complete message including the measurement report based on the indicator.
Public/Granted literature
- US20200305014A1 METHOD AND APPARATUS FOR MEASURING FREQUENCY IN WIRELESS COMMUNICATION SYSTEM Public/Granted day:2020-09-24
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