Invention Grant
- Patent Title: Methods and systems for shear wave elastography
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Application No.: US16604811Application Date: 2018-04-11
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Publication No.: US11357478B2Publication Date: 2022-06-14
- Inventor: Heng Yang , Brian W. Anthony , Felix Jan van de Donk
- Applicant: Massachusetts Institute of Technology
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: Strategic Patents, P.C.
- International Application: PCT/US2018/027113 WO 20180411
- International Announcement: WO2018/191381 WO 20181018
- Main IPC: A61B8/00
- IPC: A61B8/00 ; A61B8/08 ; B06B1/04 ; G01S15/89

Abstract:
A mechanical vibration source for a shear wave elastography system has a contact surface shaped to provide a point source of mechanical energy when striking a target surface of a medium. This point source usefully mitigates high frequency components and other artifacts in an induced shear wave. Other techniques may be used in combination with this mechanical energy source to improve shear wave elastography and facilitate miniaturization for deployment, e.g., within a handheld imaging device.
Public/Granted literature
- US20210196234A1 METHODS AND SYSTEMS FOR SHEAR WAVE ELASTOGRAPHY Public/Granted day:2021-07-01
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