A computer-implemented method includes monitoring, by a computing device, data measurements associated with a bottom hole assembly (BHA), and detecting, by the computing device, a plurality of possible tight instances. An individual possible tight spot instance is detected based on a data measurement satisfying a threshold. The method also includes determining, by the computing device, information identifying respective probe depths of a plurality of probes incorporated by the BHA for the individual possible tight spot instance, storing, by the computing device and in a table, the information identifying the respective probe depths for each possible tight spot instance, generating, by the computing device, a profile identifying tight spot depths based on information stored in the table; and executing, by the computing device, a mitigating instruction based on the profile to mitigate the presence of the identified tight spot depths.