Invention Grant
- Patent Title: Angle sensor system
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Application No.: US16527117Application Date: 2019-07-31
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Publication No.: US11359908B2Publication Date: 2022-06-14
- Inventor: Yongfu Cai , Hiraku Hirabayashi
- Applicant: TDK CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TDK CORPORATION
- Current Assignee: TDK CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JPJP2018-174393 20180919
- Main IPC: G01B7/30
- IPC: G01B7/30 ; G01B7/00 ; G01R33/09 ; G01R33/07 ; G01R33/00

Abstract:
A magnetic field generator generates a detection-target magnetic field related to an angle to be detected. An angle sensor includes a first and a second magnetic sensor and a processor. The first magnetic sensor detects, at a first detection position, a first applied magnetic field including the detection-target magnetic field, and generates first detection information having a correspondence with the angle to be detected. The second magnetic sensor detects, at a second detection position, a second applied magnetic field including the detection-target magnetic field, and generates second detection information having a correspondence with the angle to be detected. The processor generates an angle detection value by performing arithmetic processing using the first and second detection information. The ratio of a strength of the detection-target magnetic field at the second detection position to a strength of the detection-target magnetic field at the first detection position is 1.65 or more.
Public/Granted literature
- US20200088507A1 ANGLE SENSOR SYSTEM Public/Granted day:2020-03-19
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