Invention Grant
- Patent Title: Measurement apparatus and method
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Application No.: US17262518Application Date: 2018-07-23
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Publication No.: US11360129B2Publication Date: 2022-06-14
- Inventor: Shingo Takahashi , Shigeru Koumoto , Ryota Suzuki , Murtuza Petladwala
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2018/027521 WO 20180723
- International Announcement: WO2020/021600 WO 20200130
- Main IPC: G01R19/25
- IPC: G01R19/25 ; G01R23/16

Abstract:
Provided a method including applying a Fourier Transform to an AC current waveform measured to perform conversion thereof to a frequency domain; adjusting entire phase components of frequency spectra obtained as a result of the Fourier Transform, such that a phase component of an AC power supply frequency becomes zero; and applying an inverse Fourier Transform to the frequency spectra with the entire phase components thereof adjusted to obtain a current waveform in a time domain.
Public/Granted literature
- US20210293861A1 MEASURMENT APPARATUS AND METHOD Public/Granted day:2021-09-23
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