- Patent Title: Apparatus and method for evaluating the quality of a 3D point cloud
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Application No.: US17033766Application Date: 2020-09-26
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Publication No.: US11361420B2Publication Date: 2022-06-14
- Inventor: Jiansheng Chen , Xiaofeng Tong , Wenlong Li , Chen Ling , Amir Atzmoni
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Nicholson De Vos Webster & Elliott LLP
- Priority: CN201911408606.8 20191231
- Main IPC: G06T7/11
- IPC: G06T7/11 ; G06K9/62 ; G06T3/40 ; G06T7/73 ; G06T7/55 ; G06T1/20 ; G06T7/00

Abstract:
The present disclosure provides an apparatus and method for evaluate the quality of a three dimensional (3D) point cloud. The apparatus comprises an image segmenter to generate a segmented two-dimensional (2D) image for each of the plurality of images; a 2D mask generator to generate a 2D mask for each of the plurality of images from the 3D point cloud; a comparator to compare the segmented 2D image with the 2D mask to obtain a comparison result for each image; and an evaluator to evaluate the quality of the 3D point cloud based on aggregated comparison results for the plurality of images.
Public/Granted literature
- US20210201466A1 APPARATUS AND METHOD FOR EVALUATING THE QUALITY OF A 3D POINT CLOUD Public/Granted day:2021-07-01
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