Invention Grant
- Patent Title: Semiconductor memory device, method of manufacturing the same, and electronic device including the semiconductor memory device
-
Application No.: US16957468Application Date: 2018-09-21
-
Publication No.: US11361799B2Publication Date: 2022-06-14
- Inventor: Huilong Zhu
- Applicant: INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES
- Applicant Address: CN Beijing
- Assignee: INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES
- Current Assignee: INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES
- Current Assignee Address: CN Beijing
- Agency: Christensen, Fonder, Dardi & Herbert PLLC
- Priority: CN201810992029.0 20180828
- International Application: PCT/CN2018/107021 WO 20180921
- International Announcement: WO2020/042253 WO 20200305
- Main IPC: G11C5/06
- IPC: G11C5/06 ; H01L27/11556 ; H01L27/11582 ; H01L29/06 ; H01L29/78 ; G11C16/08 ; G11C16/24 ; H01L27/11524 ; H01L27/11529 ; H01L27/1157 ; H01L27/11573

Abstract:
A semiconductor memory device including a substrate; an array of memory cells arranged in rows and columns on the substrate, each memory cell comprising a vertical pillar-shaped active region having upper and lower source/drain regions and a channel region, and a gate stack formed around the channel region; a plurality of bit lines on the substrate, each bit line located below a column of memory cells and electrically connected to the lower source/drain regions of the memory cells; and a plurality of word lines on the substrate, each word line extending in a row direction and connected to gate conductors of the memory cells in a row of memory cells, each word line comprising first portions extending along peripheries of the memory cells and second portions extending between the first portions, the first portions of the word line extending in a conformal manner with sidewalls of the upper source/drain regions.
Public/Granted literature
Information query