Invention Grant
- Patent Title: Semiconductor device and fabrication method thereof
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Application No.: US16861381Application Date: 2020-04-29
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Publication No.: US11362214B2Publication Date: 2022-06-14
- Inventor: Nan Wang
- Applicant: Semiconductor Manufacturing International (Shanghai) Corporation , Semiconductor Manufacturing International (Beijing) Corporation
- Applicant Address: CN Shanghai; CN Beijing
- Assignee: Semiconductor Manufacturing International (Shanghai) Corporation,Semiconductor Manufacturing International (Beijing) Corporation
- Current Assignee: Semiconductor Manufacturing International (Shanghai) Corporation,Semiconductor Manufacturing International (Beijing) Corporation
- Current Assignee Address: CN Shanghai; CN Beijing
- Agency: Anova Law Group, PLLC
- Priority: CN201910356172.5 20190429
- Main IPC: H01L29/786
- IPC: H01L29/786 ; H01L29/06 ; H01L29/423 ; H01L21/265 ; H01L21/02 ; H01L21/306

Abstract:
The present disclosure provides a semiconductor device and a fabrication method. The method includes: providing a substrate; forming at least one sacrificial layer and at least one liner layer, that are alternately stacked over each other, on the substrate; etching the at least one liner layer and the at least one sacrificial layer until the substrate is exposed, to form a plurality of fins, discretely arranged on the substrate; and etching a portion of a thickness of the substrate, such that a width of the etched portion of the substrate at a bottom of the at least one sacrificial layer is less than a width of the at least one liner layer of the plurality of fins.
Public/Granted literature
- US20200343386A1 SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF Public/Granted day:2020-10-29
Information query
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