Invention Grant
- Patent Title: Memory structure with doping-induced leakage paths
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Application No.: US17007806Application Date: 2020-08-31
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Publication No.: US11367494B2Publication Date: 2022-06-21
- Inventor: Hsin-Wen Su , Shih-Hao Lin , Jui-Lin Chen , Lien Jung Hung , Ping-Wei Wang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L21/76
- IPC: H01L21/76 ; H01L27/108 ; G11C17/16 ; H01L27/112 ; H01L29/06 ; H01L21/265

Abstract:
The present disclosure provides semiconductor device and methods of forming the same. A semiconductor device according to the present disclosure includes a gate structure, a source/drain feature adjacent the gate structure, a dielectric layer disclosed over the gate structure and the source/drain feature, a gate contact disposed in the dielectric layer and over the gate structure, and a source/drain contact disposed in the dielectric layer and over the source/drain feature. The dielectric layer is doped with a dopant and the dopant includes germanium or tin.
Public/Granted literature
- US20220068413A1 Memory Structure with Doping-Induced Leakage Paths Public/Granted day:2022-03-03
Information query
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