Invention Grant
- Patent Title: Etching method and apparatus
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Application No.: US16825227Application Date: 2020-03-20
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Publication No.: US11373874B2Publication Date: 2022-06-28
- Inventor: Nobuhiro Takahashi , Ayano Hagiwara , Yasuo Asada , Tatsuya Yamaguchi
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Fenwick & West LLP
- Priority: JPJP2019-066761 20190329
- Main IPC: H01L21/311
- IPC: H01L21/311 ; H01L21/3065 ; H01L21/308

Abstract:
An etching method for etching a silicon-containing film formed in a substrate by supplying an etching gas to the substrate is provided. The method includes supplying an amine gas to the substrate, in which the silicon-containing film, a porous film, and a non-etching target film that is a film not to be etched but is etchable by the etching gas are sequentially formed adjacent to each other, so that amine is adsorbed onto walls of pores of the porous film. The method further includes supplying the etching gas for etching the silicon-containing film to the substrate in which the amine is adsorbed onto the walls of the pores of the porous film.
Public/Granted literature
- US20200312669A1 ETCHING METHOD AND APPARATUS Public/Granted day:2020-10-01
Information query
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