Invention Grant
- Patent Title: Fluorine-free tungsten deposition process employing in-situ oxidation and apparatuses for effecting the same
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Application No.: US16987717Application Date: 2020-08-07
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Publication No.: US11377733B2Publication Date: 2022-07-05
- Inventor: Fei Zhou , Raghuveer S. Makala , Rahul Sharangpani , Yusuke Mukae , Naoki Takeguchi
- Applicant: SANDISK TECHNOLOGIES LLC
- Applicant Address: US TX Addison
- Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee Address: US TX Addison
- Agency: The Marbury Law Group PLLC
- Main IPC: C23C16/08
- IPC: C23C16/08 ; C23C16/448 ; C23C16/455 ; C23C16/52 ; C23C16/02

Abstract:
A method of depositing tungsten over a substrate includes disposing the substrate into a vacuum enclosure of a tungsten deposition apparatus, performing a first tungsten deposition process that deposits a first tungsten layer over a physically exposed surface of the substrate by flowing a fluorine-containing tungsten precursor gas into the vacuum enclosure, performing an in-situ oxidation process by exposing the first tungsten layer to an oxidation agent gas while the substrate remains within the vacuum enclosure without breaking vacuum and forming a tungsten oxyfluoride gas which is pumped out of the vacuum enclosure, and performing a second tungsten deposition process that deposits a second tungsten layer on the first tungsten layer by flowing the fluorine-containing tungsten precursor gas into the vacuum enclosure in a second tungsten deposition process after the in-situ oxidation process.
Information query
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