An inspection and measurement device includes a body defining a first planar face within a first bounded area, a first reference feature disposed on the first planar face within the first bounded area and corresponding with a first measurable parameter, and at least a second reference feature disposed on the first planar face within the first bounded area and corresponding with a second measurable parameter. The first and second reference features are positioned within the first bounded area for placement adjacent an element bearing the respective one of the first and second measurable parameters. The first and second reference features overlap within the first bounded area in at least one direction.