Invention Grant
- Patent Title: Marker
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Application No.: US17267933Application Date: 2019-08-09
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Publication No.: US11378392B2Publication Date: 2022-07-05
- Inventor: Hideyuki Tanaka
- Applicant: National Institute of Advanced Industrial Science and Technology
- Applicant Address: JP Tokyo
- Assignee: National Institute of Advanced Industrial Science and Technology
- Current Assignee: National Institute of Advanced Industrial Science and Technology
- Current Assignee Address: JP Tokyo
- Agency: Workman Nydegger
- Priority: JPJP2018-152963 20180815
- International Application: PCT/JP2019/031712 WO 20190809
- International Announcement: WO2020/036150 WO 20200220
- Main IPC: G01B11/26
- IPC: G01B11/26

Abstract:
In order to provide a means to uniquely estimate the attitude in a wider range of angles to thereby realize a more accurate attitude estimate, a planar marker is provided. The planar marker includes a planar visual marker having a two-dimensional pattern code and at least two attitude inversion detection patterns Fx and Fy each consisting of a transparent cylindrical body having a pattern on the side face within the range of 180 degrees around the central axis ra and being provided so as to be orthogonal to each other on the same plane as that of planar visual marker. A marker is provided that includes at least one attitude inversion detection pattern. The attitude inversion detection pattern consists of the planar visual marker and a transparent spherical body having a pattern on a hemispherical surface and is provided on the same plane as that of the planar visual marker.
Public/Granted literature
- US20210180944A1 MARKER Public/Granted day:2021-06-17
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