- Patent Title: Fine particle measuring device and fine particle measuring method
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Application No.: US16325043Application Date: 2017-06-27
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Publication No.: US11378510B2Publication Date: 2022-07-05
- Inventor: Katsutoshi Tahara
- Applicant: SONY CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SONY CORPORATION
- Current Assignee: SONY CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Chip Law Group
- Priority: JPJP2016-177001 20160909
- International Application: PCT/JP2017/023463 WO 20170627
- International Announcement: WO2018/047441 WO 20180315
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G01N15/10 ; G01N21/64

Abstract:
Provided is a fine particle measuring device and the like at least including at least two light sources having different wavelength region, a detection unit that detects light from a fluorescent reference particle in accordance with excitation light from the light sources, and an information processing unit that compares, on the basis of information detected by the detection unit, a feature quantity of an output pulse based on a reference light source among the plurality of light sources with a feature quantity of an output pulse based on at least another light source among the plurality of light sources, and adjusts an output of the another light source.
Public/Granted literature
- US20210285862A1 FINE PARTICLE MEASURING DEVICE AND FINE PARTICLE MEASURING METHOD Public/Granted day:2021-09-16
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