Invention Grant
- Patent Title: Testing device of inverter device
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Application No.: US17275444Application Date: 2019-09-02
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Publication No.: US11378628B2Publication Date: 2022-07-05
- Inventor: Yoshihiro Tawada , Tatsuaki Ambo
- Applicant: TOSHIBA MITSUBISHI—ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Applicant Address: JP Chuo-ku
- Assignee: TOSHIBA MITSUBISHI—ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Current Assignee: TOSHIBA MITSUBISHI—ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Current Assignee Address: JP Chuo-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- International Application: PCT/JP2019/034430 WO 20190902
- International Announcement: WO2021/044485 WO 20210311
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/42 ; G01R31/52 ; G01R31/50 ; G01R31/54 ; G01R3/00 ; G01R31/58 ; G01R31/34 ; G01R35/00

Abstract:
A testing device of an inverter device includes a power supply device including an AC-DC conversion circuit for converting AC power received from an AC power supply into DC power and a control part for controlling the AC-DC conversion circuit and a filter circuit interposed between a tested inverter device to be tested and the power supply device, having a reactor and a capacitor, and delivering the DC power output from the power supply device to the tested inverter device. The control part is configured to execute output adjustment of the AC-DC conversion circuit when a test start signal is generated to start an instantaneous voltage abnormality test which is a test changing magnitude of power supply voltage of the AC power supply in a predetermined direction being either one of increase or decrease during operation of the tested inverter device and the power supply device.
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