• Patent Title: System analysis method, system analysis apparatus, and program
  • Application No.: US16651621
    Application Date: 2017-10-10
  • Publication No.: US11378944B2
    Publication Date: 2022-07-05
  • Inventor: Masanao Natsumeda
  • Applicant: NEC Corporation
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • International Application: PCT/JP2017/036622 WO 20171010
  • International Announcement: WO2019/073512 WO 20190418
  • Main IPC: G05B23/02
  • IPC: G05B23/02
System analysis method, system analysis apparatus, and program
Abstract:
A system analysis method includes: acquiring history information indicating, based on sensor values outputted by sensors, whether one of sensor values outputted by respective sensors indicates abnormality and/or whether individual relationship between sensor values outputted by different sensors indicates abnormality in time-series manner; estimating a change point group of change points, each indicating a time point system state has changed, based on history information; estimating relevance levels, each indicating relevance to the system state between two arbitrary time points included in the change point group; generating groups of change point groups by classifying the change point group into a plurality of groups based on the history information and the relevance levels; and generating and outputting output information, as information relating abnormality per group of the change point groups.
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