Invention Grant
- Patent Title: Factor analysis apparatus, factor analysis method, and non-transitory storage medium
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Application No.: US15900455Application Date: 2018-02-20
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Publication No.: US11379493B2Publication Date: 2022-07-05
- Inventor: Sayaka Akiyama , Kohei Maruchi , Masatake Sakuma
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner L.L.P.
- Priority: JPJP2017-155966 20170810
- Main IPC: G06F16/00
- IPC: G06F16/00 ; G06F16/2458 ; G06F7/20

Abstract:
An apparatus as an aspect of the present invention is a factor analysis apparatus that analyzes a relationship between a target event that is a target of factor analysis and an assumed factor of the target event, and includes a similarity calculator, a first influence calculator, and a second influence calculator. The similarity calculator calculates a degree of similarity between a data item included in provided time-series data and the assumed factor. The first influence calculator calculates a first degree of influence indicating a degree of influence of the data item on the target event on the basis of time-series data of the data item and time-series data of the target event. The second influence calculator calculates a second degree of influence indicating a degree of influence of the assumed factor on the target event on the basis of the degree of similarity and the first degree of influence.
Public/Granted literature
- US20190050460A1 FACTOR ANALYSIS APPARATUS, FACTOR ANALYSIS METHOD, AND NON-TRANSITORY STORAGE MEDIUM Public/Granted day:2019-02-14
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