Invention Grant
- Patent Title: Technology for analyzing abnormal behavior using deep learning-based system and data imaging
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Application No.: US16644424Application Date: 2018-02-12
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Publication No.: US11379689B2Publication Date: 2022-07-05
- Inventor: Hong Yeon Cho , Tae Yang Oh , Won Woo Park
- Applicant: CTILAB CO., LTD.
- Applicant Address: KR Seoul
- Assignee: CTILAB CO., LTD.
- Current Assignee: CTILAB CO., LTD.
- Current Assignee Address: KR Seoul
- Agency: Paratus Law Group, PLLC
- Priority: KR10-2017-0114054 20170906
- International Application: PCT/KR2018/001841 WO 20180212
- International Announcement: WO2019/050108 WO 20190314
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06K9/00 ; G06N3/08 ; G10L25/18

Abstract:
Disclosed is a method of analyzing abnormal behavior by using data imaging, including: receiving data to be analyzed as an input, wherein the data to be analyzed is related to a state of a system to be analyzed; converting the inputted data to be analyzed into image data; training a neural network unit with the converted image data as an input; and detecting or predicting abnormal behavior in the system to be analyzed, at the neural network unit, which has received the image data converted from the data to be analyzed as the input and completed training.
Public/Granted literature
- US20210064926A1 TECHNOLOGY FOR ANALYZING ABNORMAL BEHAVIOR USING DEEP LEARNING-BASED SYSTEM AND DATA IMAGING Public/Granted day:2021-03-04
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