An image inspection device that determines a defect in an image of a surface to be inspected of a printed matter, based on a comparison between a captured image obtained by capturing the surface to be inspected and a master image includes a hardware processor that acquires the captured image and the master image, wherein the hardware processor: acquires region information about an image in a region having a predetermined area; specifies a processing technique of image alignment for each region in relation to the region information; executes at least an alignment process in relation to the region information as a process before the comparison by the specified alignment technique; and compares the captured image and the master image, on which the process before the comparison has been performed, and performs defect determination as to whether there is a defect in the captured image based on a comparison result.