Invention Grant
- Patent Title: Systems and methods for position verification for inspection and repairs
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Application No.: US15452708Application Date: 2017-03-07
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Publication No.: US11380452B2Publication Date: 2022-07-05
- Inventor: Mark A. Sapia
- Applicant: GE-Hitachi Nuclear Energy Americas LLC
- Applicant Address: US NC Wilmington
- Assignee: GE-Hitachi Nuclear Energy Americas LLC
- Current Assignee: GE-Hitachi Nuclear Energy Americas LLC
- Current Assignee Address: US NC Wilmington
- Agency: Ryan Alley IP
- Main IPC: G21C17/003
- IPC: G21C17/003 ; G01S15/42 ; G01S15/06 ; G01S15/88

Abstract:
NDE probes provide unique data signals from a remote object such that can be used to accurately and precisely locate a position. With a computer processor, the data signals are converted into a positional fingerprint that is compact and easily analyzed as a file or information of probe position. The positional fingerprint is stored in association with the position or object to verify a same position at another time. Another probe detects other data signals for the object at another time. Under a similar transformation into a positional fingerprint, the position of the other probe can be matched to the first by comparing positional fingerprints. The comparison may use a probabilistic comparison and/or compare several different fingerprints from several different locations and times to ensure a best match. Position verification between probes may ensure a repair has been completed in the proper location, verify system integrity or investigate potential problems.
Public/Granted literature
- US20180261344A1 SYSTEMS AND METHODS FOR POSITION VERIFICATION FOR INSPECTION AND REPAIRS Public/Granted day:2018-09-13
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