Invention Grant
- Patent Title: Semiconductor manufacturing apparatus
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Application No.: US16645960Application Date: 2019-02-14
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Publication No.: US11380523B2Publication Date: 2022-07-05
- Inventor: Yoshihide Yamaguchi , Sumiko Fujisaki
- Applicant: HITACHI HIGH-TECH CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge, P.C.
- International Application: PCT/JP2019/005262 WO 20190214
- International Announcement: WO2020/165990 WO 20200820
- Main IPC: H01J37/32
- IPC: H01J37/32 ; C23F1/12

Abstract:
Provided is a semiconductor manufacturing apparatus that can etch a metal film containing a transition metal element at high speed and with high accuracy by using a complexing gas. The semiconductor manufacturing apparatus includes: a vacuum container 60; a processing chamber 1 that is provided in the vacuum container, and includes a stage 4 on which a sample 3 formed with a metal film containing a transition metal element is placed; and a vaporization chamber 2 that is provided in the vacuum container, and includes a vaporizing nozzle unit 70 configured to vaporize a complexing gas raw material liquid supplied from an outside. A complexing gas obtained by vaporizing the complexing gas raw material liquid is introduced into the processing chamber to etch the metal film of the sample.
Public/Granted literature
- US20210233747A1 SEMICONDUCTOR MANUFACTURING APPARATUS Public/Granted day:2021-07-29
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