Invention Grant
- Patent Title: Contact and via structures for semiconductor devices
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Application No.: US16717600Application Date: 2019-12-17
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Publication No.: US11380781B2Publication Date: 2022-07-05
- Inventor: Mrunal A. Khaderbad , Keng-Chu Lin
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/417 ; H01L29/78 ; H01L21/8234 ; H01L21/768 ; H01L29/40

Abstract:
The structure of a semiconductor device with source/drain contact structures and via structures and a method of fabricating the semiconductor device are disclosed. A method for fabricating a semiconductor device includes forming a source/drain (S/D) region on a substrate, forming a S/D contact structure on the S/D region, and forming a via structure on the S/D contact structure. The forming of the via structure includes forming a via opening on the S/D contact structure, forming a non-metal passivation layer on sidewalls of the via opening, and depositing a via plug within the via opening in a bottom-up deposition process.
Public/Granted literature
- US20210184018A1 CONTACT AND VIA STRUCTURES FOR SEMICONDUCTOR DEVICES Public/Granted day:2021-06-17
Information query
IPC分类: