Invention Grant
- Patent Title: Interferometry with an achromatic interferometric superposition of electromagnetic fields
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Application No.: US17260212Application Date: 2018-07-16
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Publication No.: US11408724B2Publication Date: 2022-08-09
- Inventor: Ioachim Pupeza , Ferenc Krausz , Theresa Buberl
- Applicant: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Applicant Address: DE Munich
- Assignee: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Current Assignee: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Current Assignee Address: DE Munich
- Agency: Caesar Rivise, PC
- International Application: PCT/EP2018/069229 WO 20180716
- International Announcement: WO2020/015809 WO 20200123
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G02B27/10

Abstract:
An interferometer apparatus includes a beam splitter arranged for splitting an input beam into a first beam propagating along a first interferometer arm including a deflection mirror and a second beam propagating along a second interferometer arm including a deflection mirror. The first and second interferometer arms have an identical optical path length. A beam combiner is arranged for recombining the first and second beams into a constructive output and a destructive output. In the first interferometer arm compared with the second interferometer arm, one additional Fresnel reflection at an optically dense medium is provided and a propagation of the electromagnetic fields of the first and second beams, when recombined by the beam combiner, results in a wavelength-independent phase difference of π between the contributions of the two interferometer arms to the destructive output. Furthermore, an interferometric measurement apparatus and an interferometric measurement method are described.
Public/Granted literature
- US20210270596A1 INTERFEROMETRY WITH AN ACHROMATIC INTERFEROMETRIC SUPERPOSITION OF ELECTROMAGNETIC FIELDS Public/Granted day:2021-09-02
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