Invention Grant
- Patent Title: Measurement method, measurement device, measurement system, and measurement program
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Application No.: US17203972Application Date: 2021-03-17
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Publication No.: US11408761B2Publication Date: 2022-08-09
- Inventor: Yoshihiro Kobayashi
- Applicant: Seiko Epson Corporation
- Applicant Address: JP Toyko
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Toyko
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JPJP2020-047136 20200318
- Main IPC: G01L1/10
- IPC: G01L1/10 ; G01G19/12 ; G08G1/02

Abstract:
A measurement method includes: a physical quantity acquisition step of acquiring, based on observation information obtained by at least one observation device that observes first to N-th observation points of a structure arranged along a second direction intersecting a first direction in which a moving object moves along the structure, physical quantities at the first to N-th observation points; and an action calculation step of calculating actions x1 to xN on the first to N-th observation points based on the acquired physical quantities at the first to N-th observation points, on the assumption that, when a function indicating a correlation between an action xj on a j-th observation point and an action that the action xj has on an i-th observation point is set as yij, an acquired physical quantity at the i-th observation point is equal to a sum of values of functions yi1 to yiN.
Public/Granted literature
- US20210293606A1 Measurement Method, Measurement Device, Measurement System, And Measurement Program Public/Granted day:2021-09-23
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