Invention Grant
- Patent Title: Sealability evaluation method and the like and standard artificial leak device
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Application No.: US17050246Application Date: 2019-04-25
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Publication No.: US11408795B2Publication Date: 2022-08-09
- Inventor: Yasuhiko Higuchi , Masakazu Ito , Yuho Matsui , Mao Hirata
- Applicant: FUKUDA CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: FUKUDA CO., LTD.
- Current Assignee: FUKUDA CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Harter Secrest & Emery LLP
- Agent Jodi A. Reynolds, Esq.
- Priority: JPJP2018-091085 20180510
- International Application: PCT/JP2019/017679 WO 20190425
- International Announcement: WO2019/216243 WO 20191114
- Main IPC: G01M3/26
- IPC: G01M3/26 ; G01M3/28 ; G01M3/32 ; G01M3/00

Abstract:
It is an object of the present invention to enhance reliability of an allowable limit conductance used for setting a threshold value for evaluating sealability of a test object, and further, enhance reliability of the sealability evaluation. By leak testing a test object 9A with a sealing defect 9g, a leakage characteristic that shows a relationship between an internal-external pressure difference and a leak flow rate is obtained. A conductance of a test object with a similar artificial leak 9B having a similar artificial leak device 29 disposed therein, conducting the leak-detected substance is measured. The similar artificial leak device 29 has a leakage characteristic similar to the obtained leakage characteristic. An allowable limit conductance is obtained based on results of the measurement. Sealability of a test object 9 is evaluated based on a threshold value set with a standard artificial leak device 9S having the allowable limit conductance.
Public/Granted literature
- US20210080341A1 SEALABILITY EVALUATION METHOD AND THE LIKE AND STANDARD ARTIFICIAL LEAK DEVICE Public/Granted day:2021-03-18
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