Invention Grant
- Patent Title: Position sensor and position measurements using millimeter-wave metamaterial
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Application No.: US16524543Application Date: 2019-07-29
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Publication No.: US11408977B2Publication Date: 2022-08-09
- Inventor: Dirk Hammerschmidt
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Design IP
- Main IPC: G01S7/41
- IPC: G01S7/41 ; H01Q15/14 ; G01S13/06 ; G01D5/48

Abstract:
A rotation sensor system includes a rotatable target object configured to rotate about a rotational axis in a rotation direction; a first millimeter-wave (mm-wave) metamaterial track coupled to the rotatable target object, where the first mm-wave metamaterial track is arranged around the rotational axis, and where the first mm-wave metamaterial track includes a first array of elementary structures having at least one first characteristic that changes around a perimeter of the first mm-wave metamaterial track; at least one transmitter configured to transmit a first electro-magnetic transmit signal towards the first mm-wave metamaterial track, where the first mm-wave metamaterial track converts the first electro-magnetic transmit signal into a first electro-magnetic receive signal; at least one receiver configured to receive the first electro-magnetic receive signal; and at least one processor configured to determine a rotational position of the rotatable target object based on the received first electro-magnetic receive signal.
Public/Granted literature
- US20210033703A1 POSITION SENSOR AND POSITION MEASUREMENTS USING MILLIMETER-WAVE METAMATERIAL Public/Granted day:2021-02-04
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