In an approach for generating hardware failure labels, a processor receives sensor data from a plurality of sensors associated with a hardware system. A processor calculates an adaptive stress factor, wherein the adaptive stress factor is a dynamic selection model. A processor calculates an adaptive stress time window, wherein the adaptive stress time window is a spatial distribution of the adaptive stress factor. A processor calculates a relative duty cycle, wherein the relative duty cycle is a first function of an internal state of the hardware system, a type of input to the hardware system, the adaptive stress factor, and the adaptive stress time window. A processor generates a failure label, wherein the failure label is calculated as a second function of the relative duty cycle and a design duty cycle.