Invention Grant
- Patent Title: Managing probabilistic data integrity scans in workloads with localized read patterns
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Application No.: US17112014Application Date: 2020-12-04
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Publication No.: US11409599B2Publication Date: 2022-08-09
- Inventor: Saeed Sharifi Tehrani
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Nicholson De Vos Webster & Elliott LLP
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F12/0831 ; G06F11/30 ; G06F11/07

Abstract:
Exemplary methods, apparatuses, and systems include receiving read operations. The read operations are divided into a current set of a sequence of read operations and one or more other sets of sequences of read operations. An aggressor read operation is selected from the current set. A data integrity scan is performed on a victim of the aggressor read operation. A read margin for a victim of the aggressor read operation is determined based on the error rate. An identifier associated with the aggressor is added to a cache and a counter for the identifier added to the cache is initialized based upon the determined read margin.
Public/Granted literature
- US20220179738A1 MANAGING PROBABILISTIC DATA INTEGRITY SCANS IN WORKLOADS WITH LOCALIZED READ PATTERNS Public/Granted day:2022-06-09
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