An integrated circuit (IC) power-up testing method, an IC power-up testing device, a storage medium and an electronic equipment are disclosed. The IC power-up testing method includes: obtaining power-up testing parameters for an IC; obtaining a plurality of power-up testing waveforms; generating a plurality of power-up test instances by conducting parameter assignments for the power-up testing waveforms based on the power-up testing parameters; and performing power-up tests on the IC using the plurality of power-up test instances. The method allows simulating various IC power-up scenarios through a plurality of power-up test instances.