Invention Grant
- Patent Title: Memory system having semiconductor memory device that performs verify operations using various verify voltages
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Application No.: US17196140Application Date: 2021-03-09
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Publication No.: US11410732B2Publication Date: 2022-08-09
- Inventor: Masanobu Shirakawa , Kenta Yasufuku , Akira Yamaga
- Applicant: KIOXIA CORPORATION
- Applicant Address: JP Tokyo
- Assignee: KIOXIA CORPORATION
- Current Assignee: KIOXIA CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Kim & Stewart LLP
- Priority: JP2015-179942 20150911
- Main IPC: G11C16/10
- IPC: G11C16/10 ; G11C11/56 ; G11C16/04 ; G11C16/08 ; G11C16/34 ; G11C16/26

Abstract:
A memory system includes a semiconductor memory device having memory cells arranged in rows and columns, and a controller configured to issue a write command with or without a partial page program command to the semiconductor memory device. The semiconductor memory device, in response to the write command issued without the partial page command, executes a first program operation on a page of memory cells and then a first verify operation on the memory cells of the page using a first verify voltage for all of the memory cells of the page, and in response to the write command issued with the partial page command, executes a second program operation on a subset of the memory cells of the page and then a second verify operation on the memory cells of the subset using one of several different second verify voltages corresponding to the subset.
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