Invention Grant
- Patent Title: Semiconductor devices and methods of manufacturing
-
Application No.: US17097301Application Date: 2020-11-13
-
Publication No.: US11410982B2Publication Date: 2022-08-09
- Inventor: Chang-Yi Yang , Po-Yao Chuang , Shin-Puu Jeng
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L25/18
- IPC: H01L25/18 ; H01L25/16 ; H01L25/00 ; H01L21/48 ; H01L23/498 ; H01L23/538 ; H01L21/683

Abstract:
A method includes forming a redistribution structure including metallization patterns; attaching a semiconductor device to a first side of the redistribution structure; encapsulating the semiconductor device with a first encapsulant; forming openings in the first encapsulant, the openings exposing a metallization pattern of the redistribution structure; forming a conductive material in the openings, comprising at least partially filling the openings with a conductive paste; after forming the conductive material, attaching integrated devices to a second side of the redistribution structure; encapsulating the integrated devices with a second encapsulant; and after encapsulating the integrated devices, forming a pre-solder material on the conductive material.
Public/Granted literature
- US20210305228A1 SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING Public/Granted day:2021-09-30
Information query
IPC分类: