Invention Grant
- Patent Title: Methods of screening for onychomycotic fungi
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Application No.: US15222652Application Date: 2016-07-28
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Publication No.: US11414713B2Publication Date: 2022-08-16
- Inventor: Kiran Madanahally Divakar , Bradley Wayne Bakotic , Laurie Susan Page , Lori Ilene Bennett
- Applicant: Bakotic Pathology Associates, LLC
- Applicant Address: US GA Alpharetta
- Assignee: Bakotic Pathology Associates, LLC
- Current Assignee: Bakotic Pathology Associates, LLC
- Current Assignee Address: US GA Alpharetta
- Agency: Bozicevic, Field & Francis LLP
- Agent James S. Keddie
- Main IPC: C12Q1/6895
- IPC: C12Q1/6895

Abstract:
Provided herein is a method of detecting an onychomycotic fungus in a sample, wherein the onychomycotic fungus belongs to a secondary clade member including one or more primary clade members. The method may include the steps of i) screening a sample using a first and second sets of secondary clade-specific primers to determine whether a secondary clade member among a plurality of secondary clade members is present or absent in the sample, where the plurality of secondary clade members includes (a) a dermatophyte, (b) a candida, and (c) a saprophyte, and ii) after determining the presence of the secondary clade member, screening the sample to determine whether an onychomycotic fungus is present or absent in the sample using primary clade-specific primers that are specific to a primary clade member that belongs to the secondary clade member. Also provided is a kit that finds use in implementing the present method.
Public/Granted literature
- US20170029906A1 METHODS OF SCREENING FOR ONYCHOMYCOTIC FUNGI Public/Granted day:2017-02-02
Information query
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