Invention Grant
- Patent Title: Single sideband frequency modulated laser measurement for detecting a difference in a propagation distance
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Application No.: US17125896Application Date: 2020-12-17
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Publication No.: US11415406B2Publication Date: 2022-08-16
- Inventor: Shinji Komatsuzaki , Tomotaka Takahashi , Hiroki Ujihara
- Applicant: Mitutoyo Corporation , 3D Innovation Co., Ltd
- Applicant Address: JP Kanagawa; JP Sendai Miyagi
- Assignee: Mitutoyo Corporation,3D Innovation Co., Ltd
- Current Assignee: Mitutoyo Corporation,3D Innovation Co., Ltd
- Current Assignee Address: JP Kanagawa; JP Sendai Miyagi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JPJP2019-228280 20191218
- Main IPC: G01B9/02002
- IPC: G01B9/02002 ; G01B11/14 ; G01B11/24 ; H01S3/106 ; H01S3/067 ; G01B9/02015

Abstract:
A laser apparatus, a measurement apparatus, and a measurement method are provided in which the laser apparatus outputs a frequency-modulated laser beam with a plurality of modes and includes: an optical cavity that has a gain medium for amplifying a light to be input, and an optical SSB modulator for shifting a frequency of the light amplified by the gain medium: and a control part that controls the optical SSB modulator to shift a frequency of a light to be input to the optical SSB modulator.
Public/Granted literature
- US20210190474A1 LASER APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD Public/Granted day:2021-06-24
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