Invention Grant
- Patent Title: Measurement probe apparatus and method
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Application No.: US16644048Application Date: 2018-09-26
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Publication No.: US11415412B2Publication Date: 2022-08-16
- Inventor: Jamie John Buckingham , Michael John Wooldridge , Ben Richard Holden , Stephen Peter Ewen
- Applicant: RENISHAW PLC
- Applicant Address: GB Wotton-under-Edge
- Assignee: RENISHAW PLC
- Current Assignee: RENISHAW PLC
- Current Assignee Address: GB Wotton-under-Edge
- Agency: Oliff PLC
- Priority: EP17193086 20170926
- International Application: PCT/GB2018/052729 WO 20180926
- International Announcement: WO2019/063991 WO 20190404
- Main IPC: G01B21/04
- IPC: G01B21/04 ; G01B5/012 ; G01B7/012

Abstract:
A measurement probe is described that includes a probe body, a stylus that is deflectable relative to the probe body, and a plurality of sensor elements for generating a sensor signal indicative of stylus deflection. An analyser is provided, optionally as part of a trigger unit, to analyse the sensor signals and issues a trigger signal to indicate the stylus has contacted an object. The analyser is arranged to combine a plurality of the sensor signals to generate a resultant deflection signal for comparison to a deflection threshold and is also arranged to detect oscillatory motion of the stylus by analysing at least one of the sensor signals. The analyser only issues a trigger signal when the resultant deflection signal crosses the deflection threshold and no oscillatory motion of the stylus is detected. The measurement probe may be used on a machine tool or other coordinate positioning apparatus.
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