Invention Grant
- Patent Title: Plasma etch-resistant film and a method for its fabrication
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Application No.: US17137205Application Date: 2020-12-29
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Publication No.: US11421319B2Publication Date: 2022-08-23
- Inventor: Pekka J. Soininen , Vasil Vorsa , Mohammad Ameen
- Applicant: BENEQ OY
- Applicant Address: FI Espoo
- Assignee: BENEQ OY
- Current Assignee: BENEQ OY
- Current Assignee Address: FI Espoo
- Agency: Ware, Fressola, Maguire & Barber LLP
- Priority: FI20165181 20160304
- Main IPC: C23C16/40
- IPC: C23C16/40 ; C09D1/00 ; C23C16/455 ; H01J37/32

Abstract:
The invention relates to a method for fabricating a plasma etch-resistant film (1) on a surface of a substrate (2), wherein the method comprises the step of forming a film comprising an intermediate layer (4) of rare earth metal oxide, rare earth metal carbonate, or rare earth metal oxycarbonate, or any mixture thereof on a first layer (3) of rare earth metal oxide, wherein the rare earth metal is the same in the first layer and in the intermediate layer. The invention further relates to a plasma etch-resistant film and to the use thereof.
Public/Granted literature
- US20210115555A1 PLASMA ETCH-RESISTANT FILM AND A METHOD FOR ITS FABRICATION Public/Granted day:2021-04-22
Information query
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