Invention Grant
- Patent Title: System for analyzing a test sample and method therefor
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Application No.: US16212499Application Date: 2018-12-06
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Publication No.: US11422084B2Publication Date: 2022-08-23
- Inventor: Axel Scherer , Amirhossein Nateghi , Taeyoon Jeon
- Applicant: California Institute of Technology
- Applicant Address: US CA Pasadena
- Assignee: California Institute of Technology
- Current Assignee: California Institute of Technology
- Current Assignee Address: US CA Pasadena
- Agency: Kaplan Breyer Schwarz, LLP
- Main IPC: G01N21/03
- IPC: G01N21/03 ; G01N1/42 ; G01N1/44 ; G01N21/17 ; G01N21/25 ; G01N21/35 ; G01N21/3504 ; G01N21/3577

Abstract:
The present disclosure is directed toward a measurement system capable of rapid spectroscopic and calorimetric analysis of the chemical makeup of a test sample. Systems in accordance with the present disclosure include a low-thermal-mass sample holder having a substrate whose surface has been engineered to create a large-area sample-collection surface. The sample holder includes an integrated temperature controller that can rapidly heat or cool the test sample. As a result, the sample holder enables differential scanning calorimetry Fourier-Transform Infrared Spectroscopy (DSC-FTIR) that can be performed in minutes rather than hours, as required in the prior art.
Public/Granted literature
- US20190170637A1 System for Analyzing a Test Sample and Method Therefor Public/Granted day:2019-06-06
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