Invention Grant
- Patent Title: Inspection position identification method, three-dimensional image generation method, and inspection device
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Application No.: US16652016Application Date: 2018-09-26
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Publication No.: US11422099B2Publication Date: 2022-08-23
- Inventor: Takuma Hirayama , Yosuke Yamamoto
- Applicant: SAKI CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SAKI CORPORATION
- Current Assignee: SAKI CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Hauptman Ham, LLP
- Priority: JPJP2017-187450 20170928,JPJP2017-187451 20170928
- International Application: PCT/JP2018/035606 WO 20180926
- International Announcement: WO2019/065701 WO 20190404
- Main IPC: G01N23/044
- IPC: G01N23/044 ; G01N23/083 ; G06T7/00 ; G06T15/08 ; G01N23/18 ; G06T7/33

Abstract:
An inspection position identification method that allows accurate inspection to be performed without in-advance identification of the position of an inspection plane in an inspected target. A three-dimensional image generation method that allows generation of a three-dimensional image for inspection without in-advance identification of the position of an inspection plane in an inspected target and then allows inspection to be performed. An inspection device including the methods. An inspection device includes a storage unit, which stores a radiation transmission image of an inspected object and a three-dimensional image generated from the radiation transmission image, and a control unit. The process carried out by the control unit for identifying an inspection position in a three-dimensional image includes identifying the position of a transmission picture of the inspection position in the radiation transmission image and identifying the inspection position in the three-dimensional image from the position of the transmission picture.
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