- Patent Title: Frequency measurement method and frequency measurement apparatus
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Application No.: US16829187Application Date: 2020-03-25
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Publication No.: US11422174B2Publication Date: 2022-08-23
- Inventor: Jinlei Xing , Shanshan Luo
- Applicant: Schneider Electric Industries SAS
- Applicant Address: FR Rueil-Malmaison
- Assignee: Schneider Electric Industries SAS
- Current Assignee: Schneider Electric Industries SAS
- Current Assignee Address: FR Rueil-Malmaison
- Agency: Locke Lord LLP
- Priority: CN201910231301.8 20190326
- Main IPC: G01R23/16
- IPC: G01R23/16 ; G01R23/02 ; G01R25/00

Abstract:
A frequency measurement method is provided, which comprising: sampling a voltage to be measured with a fixed sampling frequency; obtaining a positive-sequence voltage angle change amount for a predetermined operation interval time by using a sampling sample obtained by the sampling and based on a discrete Fourier transform (DFT) calculation; obtaining a frequency offset amount by using the positive-sequence voltage angle change amount; and obtaining a frequency-related measurement value by using the frequency offset amount. A frequency measurement apparatus is also provided. measurement value. This frequency measurement method does not require iterative calculations, and directly obtains frequency-dependent measurement values, thereby responding quickly to frequency changes. In addition, a frequency measurement apparatus is also provided.
Public/Granted literature
- US20200309830A1 FREQUENCY MEASUREMENT METHOD AND FREQUENCY MEASUREMENT APPARATUS Public/Granted day:2020-10-01
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