Invention Grant
- Patent Title: Storage device and storage system including a memory to store a check code for an integrity check
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Application No.: US17121024Application Date: 2020-12-14
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Publication No.: US11422712B2Publication Date: 2022-08-23
- Inventor: Yasuhito Yoshimizu , Takashi Fukushima , Tatsuro Hitomi , Arata Inoue , Masayuki Miura , Shinichi Kanno , Toshio Fujisawa , Keisuke Nakatsuka , Tomoya Sanuki
- Applicant: Kioxia Corporation
- Applicant Address: JP Tokyo
- Assignee: Kioxia Corporation
- Current Assignee: Kioxia Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: G06F3/06
- IPC: G06F3/06 ; G06F12/1009 ; G06F12/02

Abstract:
According to one embodiment, a storage device includes a stage on which a semiconductor wafer can be mounted, wherein data is capable of being read from the semiconductor wafer or data is capable of being written to the semiconductor wafer. The storage device further includes a plurality of probe pins for reading or writing data, and a controller connected the probe pins. The semiconductor wafer includes electrodes connectable to the probe pins, a first memory area that can store user data, and a second memory area that can store identification information for identification of the semiconductor wafer and a check code for checking integrity of the identification information. The controller is capable of reading the identification information and the check code from the second memory area.
Public/Granted literature
- US20210149568A1 STORAGE DEVICE AND STORAGE SYSTEM Public/Granted day:2021-05-20
Information query