Invention Grant
- Patent Title: Capacitance measuring circuit and electrostatic capacitive displacement meter
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Application No.: US17082015Application Date: 2020-10-28
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Publication No.: US11428548B2Publication Date: 2022-08-30
- Inventor: Shingo Sobukawa , Keita Murase , Takehito Kamimura
- Applicant: NF HOLDINGS CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: NF HOLDINGS CORPORATION
- Current Assignee: NF HOLDINGS CORPORATION
- Current Assignee Address: JP Kanagawa
- Priority: JPJP2018-089945 20180508
- Main IPC: G01D5/241
- IPC: G01D5/241 ; G01R27/26 ; G01B7/02 ; G01D5/24

Abstract:
A capacitance measuring circuit measures an electrostatic capacitance formed between a first conductor that receive an AC signal and a second conductor. The capacitance measuring circuit includes an amplifier including an input and an output; signal detection means including a negative feedback unit that has a feedback capacitance and applies a negative feedback from an output of the amplifier to an input of the amplifier, wherein an input of the amplifier is connected to the second conductor and is virtually grounded by the negative feedback unit and an AC signal of an amplitude in a functional relation with the electrostatic capacitance is output; and measuring means that is connected to an output of the signal detection means and has a function of measuring at least an amplitude of an AC signal output of the signal detection means.
Public/Granted literature
- US20210072048A1 CAPACITANCE MEASURING CIRCUIT AND ELECTROSTATIC CAPACITIVE DISPLACEMENT METER Public/Granted day:2021-03-11
Information query
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